Surface Crystallization of Cordierite from Glass Studied by High-Temperature X-ray Diffraction and Electron Backscatter Diffraction (EBSD)

Abstract

A glass with the composition of stoichiometric cordierite (2Al 2 O 3 ·2MgO·5SiO 2 ) shows surface crystallization during thermal annealing. High temperature X-ray diffraction (HT-XRD) was performed on a compact sample. The surface crystallization is further studied using scanning electron microscopy (SEM) and electron backscatter diffraction (EBSD). The formation of an oriented layer at the immediate surface is not observed. This is in disagreement with previous reports in the literature. Topographical effects during crystallization and EBSD pattern acquisition are analyzed by atomic force microscopy.