Concepedia

Publication | Open Access

Secondary Ion Mass Spectrometry (SIMS)

DOIFull Paper Access

37

Citations

2

References

1993

Year

Masahiro Kudo, Susumu Nagayama
Zairyo-to-Kankyo

Abstract

Secondary Ion Mass Spectrometry (SIMS) has been regarded as one of the most sensitive techniques for the three dimensional surface quantitative analysis.

References

YearCitations

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