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Effects of Annealing Temperature on the Structural and the Optical Properties of ZnO Thin Films Grown on Porous Silicon by Using Plasma-assisted Molecular Beam Epitaxy

Materials EngineeringMaterials ScienceOptical MaterialsEngineeringOptical PropertiesNanoelectronicsOxide ElectronicsApplied PhysicsAnnealing TemperatureThin FilmsMolecular Beam EpitaxyPorous SiliconThin Film Processing