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Microwave Dielectric Properties with Optimized Mn-Doped Ba<sub>0.6</sub>Sr<sub>0.4</sub>TiO<sub>3</sub> Highly Epitaxial Thin Films
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Citations
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References
2010
Year
Materials ScienceEpitaxial GrowthAdditional Mn DopingEngineeringOxide ElectronicsApplied PhysicsFerroelectric MaterialsAs-grown Thin FilmsMicrowave MeasurementThin FilmsMicrowave Dielectric PropertiesSharp InterfaceMicrowave EngineeringMolecular Beam Epitaxy
Pure and Mn doped Ba0.6Sr0.4TiO3 (0.5%, 2%) (BST) thin films were epitaxially grown on the (001) LaAlO3 using pulsed laser deposition. Microstructural characterizations indicate that the as-grown thin films have excellent single crystalline quality and epitaxial nature with an atomically sharp interface and an interface relationship of [100]film//[100]LAO and (001)film//(001)LAO. Microwave dielectric property measurements indicate that the additional Mn doping can significantly enhance the microwave dielectric properties of the BST films.
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