Concepedia

Publication | Closed Access

Flat-Panel X-Ray Detector Using Amorphous Silicon Technology

DOI

34

Citations

14

References

1997

Year

Markus Völk, M. Strotzer, J. Gmeinwieser, JOACHIM ALEXANDER, Rüdiger Fründ, JOHANNES SEITZ, C. Manke, M. Spahn, Stefan Feuerbach
Investigative Radiology

Abstract

Flat-panel x-ray detector technology allows significant reduction in radiation dose compared with screen-film radiography without loss of diagnostic accuracy.

References

YearCitations

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