Japanese Journal of Applied Physics · 1974 · 18 citations · 0 references
Natural SciencesChemistryMaterials ScienceCrystal StructureMaterials CharacterizationThin FilmsOptical Thin FilmsThin Film Optical PropertiesThin-film DepositionThin-film MaterialsFilm ThicknessHigh-vacuum DepositionOptical Thin Film CharacterizationRefractive Index DeterminationThin-film Optical Characterization
Thin films of ZnS made by evaporation in high vacuum were investigated by different analytical methods. The changes in chemical composition, crystal structure, texture, density and refractive index of these films are shown as a function of film thickness.