Crystal Growth and Characterization of Alexandrite

Abstract

Large, high-quality alexandrite single crystals (Cr-doped Al 2 BeO 4 ) with dimensions of up to 120 mm were grown from molten alexandrite-based fluxes in the temperature range of 1800–1853 °C using the Stepanov and Kyropoulos methods. Etching experiments resulted in a maximum pits density of 10 5 cm –2 . Powder X-ray diffraction was used to establish the dependence of unit cell dimensions on the Cr content. Optical absorption spectroscopy (UV–vis) revealed nonlinear absorption dependence on the Cr content.