X-ray absorption spectroscopy of silicon dioxide (SiO2) polymorphs : the structural characterization of opal

Dien Li, G.M. Bancroft, M. Kasrai, Michael E. Fleet, Richard A. Secco, X. H. Feng, K. H. Tan, B. X. Yang

American Mineralogist · 1994 · 128 citations · 0 references

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