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GaN-Based High Temperature and Radiation-Hard Electronics for Harsh Environments
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2010
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Wide-bandgap SemiconductorElectrical EngineeringEngineeringRf SemiconductorNanoelectronicsApplied PhysicsAluminum Gallium NitrideGan Power DeviceRadiation-hard ElectronicsGan-based High TemperatureData Acquisition ElectronicsMicroelectronicsOptoelectronicsCategoryiii-v SemiconductorHarsh Planetary Environments
We develop novel GaN-based high temperature and radiation-hard electronics to realize data acquisition electronics and transmitters suitable for operations in harsh planetary environments. In this paper, we discuss our research on metal-oxide-semiconductor (MOS) transistors that are targeted for 500 (sup o)C operation and >2 Mrad radiation hardness. For the target device performance, we develop Schottky-free AlGaN/GaN MOS transistors, where a gate electrode is processed in a MOS layout using an Al2O3 gate dielectric layer....