Differentiation of Deformation Modes in Nanocrystalline Pd Films Inferred from Peak Asymmetry Evolution Using<i>In Situ</i>X-Ray Diffraction

Abstract

Synchrotron-based in situ tensile testing was used to study the dominant deformation mechanisms of nanocrystalline Pd thin films on a compliant substrate. An x-ray diffraction peak profile analysis reveals an (hkl) independent deformation induced peak asymmetry. It is argued that the asymmetry is caused by a broad distribution of elastic strains among individual grains and the complexity of accommodation processes. The reversal of peak asymmetry manifests the transition from heterogeneous microplasticity to dislocation-based macroplasticity. Independently, stress-driven grain boundary migration is active.