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Thickness Dependence of Properties of ZnO Thin Films on Porous Silicon Grown by Plasma-assisted Molecular Beam Epitaxy
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2011
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Materials ScienceEpitaxial GrowthThickness DependenceEngineeringNanotechnologyOxide ElectronicsApplied PhysicsThin FilmsPorous Silicon GrownMolecular Beam EpitaxyZno Thin FilmsThin Film Processing
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