TiN-buffered substrates for photoelectrochemical measurements of oxynitride thin films - Concepedia

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TiN-buffered substrates for photoelectrochemical measurements of oxynitride thin films

22

Citations

55

References

2016

Year

Markus Pichler, Daniele Pergolesi, Steve Landsmann, Vipin Chawla, Johann Michler, M. Döbeli, Alexander Wokaun, Thomas Lippert

Applied Surface Science

Chemical EngineeringEngineeringPhotochemistrySurface ScienceOxynitride Thin FilmsThin FilmsPhotoelectrochemistryThin Film Processing

References

	Year	Citations

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