Infoscience (Ecole Polytechnique Fédérale de Lausanne) · 2000 · 15 citations · 0 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSensorsMicroelectromechanical SensorsTemperature MeasurementTemperature SensorsThermal SensorsThermal StressesThermomechanical AnalysisSensor DriftTemperature DriftTemperature Sensor DriftThermal Effects In Integrated CircuitsThermo-mechanical EffectsThermo-mechanical FailureThermo-mechanical StressThermomechanical Stress
These Ecole polytechnique federale de Lausanne EPFL, n° 2213 (2000)Faculte des sciences et techniques de l'ingenieurJury: Ioannis Botsis, Gerard Meijer, Philippe Renaud, Ninoslav Stojadinovic Public defense: 2000-7-28 Reference doi:10.5075/epfl-thesis-2213Print copy in library catalog Record created on 2005-03-16, modified on 2016-08-08