PV Yield Prediction for Thin Film Technologies and the Effect of Input Parameters Inaccuracies

Abstract

Accuracy of the PV yield prediction process, including meteorological data (direct and diffuse irradiance including its actual spectral composition and spatial distribution), material properties of encapsulation (refractive indices, absorption coefficients, and thermal properties), parameters relevant for heat transfer and heat dissipation, PV conversion parameters of the cells (spectral response, weak light performance, temperature coefficients, degradation) considerably depends on the quality of the input data applied (derived from literature, data sheets, norms, software tools, or own measurements). The contribution gives an overview of the processes involved, the relevant parameters, the accuracy achievable and the impact on yield prediction.