Contact-resistance effects in PDI8-CN 2 n-type thin-film transistors investigated by Kelvin-probe potentiometry - Concepedia

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Contact-resistance effects in PDI8-CN 2 n-type thin-film transistors investigated by Kelvin-probe potentiometry

32

Citations

28

References

2015

Year

Fabio Chiarella, Mario Barra, Antonio Carella, L. Parlato, E. Sarnelli, A. Cassinese

Organic Electronics

Materials ScienceElectrical EngineeringEngineeringApplied PhysicsContact-resistance EffectsKelvin-probe PotentiometrySemiconductor MaterialSemiconductor DevicePdi8-cn 2

References

	Year	Citations

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