Concepedia
Electrochimica Acta · 2015 · 203 citations · 32 references
Open access
Natural SciencesMaterials EngineeringMaterials ScienceMaterials CharacterizationMetallic MaterialsThin FilmsMetalsThin-film MaterialsFilm ThicknessFilm Thickness MeasurementMetal Thin FilmsMetallic Thin FilmsPassive Film
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Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids
M. P. Seah, W. A. Dench · Surface and Interface Analysis · 1979 · 5.3K citations
Natural Sciences, Materials Science, Physics +17
The analysis of electrode impedances complicated by the presence of a constant phase element
G.J. Brug, A.L.G. van den Eeden, M. Sluyters‐Rehbach et al. · Journal of Electroanalytical Chemistry · 1984 · 3.6K citations · Full text
Natural Sciences, Electrical Engineering, Circuit Theory +13
Handbook of Thin Film Technology
L. I. Maissel, R. Glang, Paul P. Budenstein · Journal of The Electrochemical Society · 1971 · 2.8K citations
Natural Sciences, Materials Engineering, Materials Science +12
Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50–2000 eV range
Shigeo Tanuma, C. J. Powell, David R. Penn · Surface and Interface Analysis · 1994 · 2.7K citations
Natural Sciences, Chemistry, Physics +13
Determination of effective capacitance and film thickness from constant-phase-element parameters
Bryan Hirschorn, Mark E. Orazem, Bernard Tribollet et al. · Electrochimica Acta · 2009 · 2.5K citations
Natural Sciences, Materials Engineering, Materials Science +15