Synchrotron-radiation XPS analysis of ultra-thin silane films: Specifying the organic silicon - Concepedia

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Synchrotron-radiation XPS analysis of ultra-thin silane films: Specifying the organic silicon

97

Citations

24

References

2015

Year

Paul Dietrich, Stephan Glamsch, Christopher Ehlert, Andreas Lippitz, Nora Kulak, Wolfgang E. S. Unger

Applied Surface Science

Ultra-thin Silane FilmsEngineeringPhysicsApplied PhysicsSynchrotron-radiation Xps AnalysisOrganic SiliconThin FilmsSilicon On InsulatorThin Film ProcessingSolar Cell Materials

References

	Year	Citations

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