Indian Journal of Pure & Applied Physics · 2006 · 24 citations · 0 references
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Natural SciencesMaterials EngineeringMaterials ScienceMaterials ChemistrySolid State PhysicsSolid-state ChemistryCrystal ChemistryCrystal GrowthCrystalline MaterialsCrystallization ProcessesCrystallographyMineral GrowthCrystal Growth MechanismsCrystal Growth MorphologyGrowth MechanismsMicrohardness DistributionMicroscopic Crystal Analysis
Mixed crystals of (NH 4 ) 2 SbF 5 -K 2 SbF 5 , an electro-optic material have been grown by isothermal evaporation technique. Powder X-ray diffraction method has been used for structural identification and determination of lattice parameters. Load dependent microhardness measurements on this crystal reveal the mechanical behaviour of the material. The work hardening co-efficient and the yield strength of the material were found to be 11.66 and 2.058 Mpa, respectively.