Measurement of the permittivity and loss of high-loss materials using a Near-Field Scanning Microwave Microscope - Concepedia

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Measurement of the permittivity and loss of high-loss materials using a Near-Field Scanning Microwave Microscope

21

Citations

21

References

2015

Year

Andrew Gregory, J. F. Blackburn, K. Lees, R.N. Clarke, T.E. Hodgetts, Stephen M. Hanham, N. Klein

Ultramicroscopy

Materials ScienceEngineeringHigh-loss MaterialsMicroscopyOptical PropertiesAntennaApplied PhysicsMicrowave MeasurementMicrowave EngineeringElectrical PropertyElectrical Insulation

References

	Year	Citations

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