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Indium tin oxide nanowhisker morphology control by vapour–liquid–solid glancing angle deposition
46
Citations
44
References
2012
Year
Materials ScienceChemical EngineeringEngineeringNanomaterialsNanotechnologySurface ScienceApplied PhysicsNew Growth TechniqueIndium Tin OxideAngle DepositionNanostructure SynthesisThin FilmsVls-glad TechniqueThin Film Process TechnologyMorphology ControlChemical Vapor DepositionThin Film Processing
A new growth technique for indium tin oxide nanowhiskers with increased control over feature size and spacing is reported. The technique is based on a unique combination of self-catalysed vapour-liquid-solid (VLS) growth and glancing angle deposition (GLAD). This VLS-GLAD technique provides enhanced control over nanowhisker morphology as the effect of typical VLS growth parameters (e.g. flux rate, temperature) is amplified at large deposition angles characteristic of GLAD. Spatial modulation of the collimated growth flux controls trunk width, number and orientation of branches, and overall nanowhisker density. Here we report the influence of growth conditions (including deposition angle, flux rate, nominal pitch and substrate temperature) on nanowhisker morphology, with specific focus on the effect of large deposition angles. Sheet resistance and transmission of the films were measured to characterize their performance as transparent conductive oxides. Hybrid nanostructured films grown in this study include high surface area nanowhiskers protruding from a conductive film, ideal for transparent conductive electrode applications.
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