AIChE Journal · 1989 · 294 citations · 11 references
Artificial IntelligenceFault DiagnosisNoisy Process MeasurementsEngineeringMachine LearningNeural Networks (Machine Learning)Intelligent DiagnosticsIncipient Fault DiagnosisDiagnosisFault ForecastingIntelligent SystemsSocial SciencesSecond StageData ScienceSystems EngineeringComputer ScienceNeural Networks (Computational Neuroscience)Automatic Fault DetectionArtificial Neural NetworksProcess ControlFault DetectionIntelligent Systems Engineering
Artificial neural networks can learn and store information about process faults through associative memory, enabling diagnostic capability based on steady‑state data collected under normal and faulty conditions, including fault degree and cause information. The study describes how to apply artificial neural networks to fault diagnosis. A two‑stage multilayer neural network is used, where the first stage discriminates fault causes from noisy measurements and the second stage estimates fault severity. This approach enables diagnosis of incipient faults.
Abstract Artificial neural networks have capacity to learn and store information about process faults via associative memory, and thus have an associative diagnostic ability with respect to faults that occur in a process. Knowledge of the faults to be learned by the network evolves from sets of data, namely values of steady‐state process variables collected under normal operating condition and those collected under faulty conditions, together with information about the degree of the faults and their causes. Here, we describe how to apply artificial neural networks to fault diagnosis. A suitable two‐stage multilayer neural network is proposed as the network to be used for diagnosis. The first stage of the network discriminates between the causes of faults when fed the noisy process measurements. Once the fault is identified, the second stage of the network estimates the degree of the fault. Thus, the diagnosis of incipient faults becomes possible.
11
Computing with Neural Circuits: A Model
J. J. Hopfield, David W. Tank · Science · 1986 · 2.1K citations