Surface and Interface Analysis · 2012 · 45 citations · 6 references
Natural SciencesChemistryEarth SciencesAnalytical ChemistryElemental AnalysisInstrumentationAnalytical GeochemistryInstrumental AnalysisIsotope GeochemistryMass Spectrometric Elemental AnalysisMass SpectrometryStable Isotope AnalysisFaraday CupsIsotope Ratio AnalysisIsotope Ratio Mass SpectrometryIsotopic Composition AnalysisIsotopic Ratio DeterminationMass Spectrometric Isotope AnalysisPrecisionSecondary Ion Mass Spectrometry
Secondary ion mass spectrometry is applied to a wide range of Geoscience applications because of its capability to provide direct in situ measurement of elemental and isotopic composition. The CAMECA IMS 1280 and 1280‐HR are large geometry ultra‐high sensitivity ion microprobes that provide excellent precision and reproducibility for isotope ratio measurements. A precision at the tenth permil level is routinely achieved for the measurement of 18 O/ 16 O ratio from 10 µm spots using multicollection Faraday Cups. However, analytical artifacts related to the surface topography and to the location of the analysis in the sample (X–Y effects) are known to bias the precision for isotope analysis. The X–Y effects have been investigated using a CAMECA prototype sample holder design. Results show a significant improvement in terms of reproducibility for analyses performed over a large area of the sample. Detailed analytical data using the new sample holder will be presented. Copyright © 2012 John Wiley & Sons, Ltd.
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High precision SIMS oxygen isotope analysis and the effect of sample topography
N. T. Kita, T. Ushikubo, Bin Fu et al. · Chemical Geology · 2009 · 489 citations