Polymethylmethacrylate by XPS

S. W. Rosencrance, Wayne K. Way, Nicholas Winograd, D. A. Shirley

Surface Science Spectra · 1993 · 16 citations · 1 references

Concepts

Abstract

X-ray photoelectron spectroscopy was used to analyze a thin film of polymethylmethacrylate (PMMA) which was spin cast from a 2% weight solution of PMMA in toluene onto a gold substrate. A Hewlett Packard 5950A ESCA spectrometer was used for this investigation.

References

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