Analysis of Poly(tetrafluoroethylene) (PTFE) by XPS

Abstract

We report x-ray photoemission spectra of poly(tetrafluoroethylene) (PTFE). XPS spectra were measured with the SSI, SSX-100 model, using monochromated Al Kα x-rays. We present the survey spectrum (binding energy range of 0–1000 eV) and narrow scans of C 1s and F 1s. The polymer is used as a reference to study the influence of PTFE surface modification by an excimer ultraviolet laser (λ = 193 nm).