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Comparison of SOFC cathode microstructure quantified using X-ray nanotomography and focused ion beam–scanning electron microscopy

DOIFull Paper Access

75

Citations

12

References

2011

Year

George J. Nelson, William M. Harris, Jeffrey J. Lombardo, John R. Izzo, Wilson K. S. Chiu, Pietro Tanasini, Marco Cantoni, Jan Van herle, Christos Comninellis, Joy C. Andrews,
Electrochemistry Communications

References

YearCitations

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