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Demonstration of Ultraviolet 6H-SiC PIN Avalanche Photodiodes
26
Citations
8
References
2006
Year
Semiconductor TechnologyPhotonicsElectrical EngineeringWide-bandgap SemiconductorEngineeringPhysicsApplied PhysicsPhotoelectric MeasurementDark Current DensityElectrooptical CharacteristicOptoelectronicsCompound SemiconductorExcess Noise Factor
We report electrical and electrooptical characteristic of mesa-structure 6H-SiC PIN avalanche photodiodes. At a gain of 1000, the dark current density is 9.2 muA/cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> . The excess noise factor corresponds to a k value of ~0.1. In addition, peak responsivity of 80 mA/W was observed at 290 nm (external quantum efficiency of ~35%)
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