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Light charged particle registration characteristics of CR-39 plastic track detectors
10
Citations
7
References
1984
Year
EngineeringNuclear PhysicsElectron-beam LithographyLatent Damage TrailAccelerator PhysicElectron MicroscopyInstrumentationAccelerator TechnologyMaterials SciencePhysicsMicroanalysisPlasticityParticle Beam PhysicsMicrostructureMaterial AnalysisNatural SciencesMaterials CharacterizationApplied PhysicsParticle Registration CharacteristicsElectron MicroscopeEtched ChannelsAlpha ParticlesParticle Accelerator
Abstract CR-39 plastic sheets have been tested for their response to protons, deuterons, and alpha particles. The enlargement of the latent damage trail has been studied (a) under varying experimental conditions, and (b) as a function of energy, restricted energy loss, and Z2 crr/β2 of the light charged particles. The critical angles of etching of CR-39 and its response curves have been obtained. Scanning-Electron-Microscopy (SEM) has been employed for studying the profiles of the etched channels.
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