Magnetostriction measurement by interferometry

G. H. Bellesis, P.S. Harlee, A. Renema, D.N. Lambeth

IEEE Transactions on Magnetics · 1993 · 22 citations · 9 references

Concepts

Abstract

A laser Doppler interferometric method using synchronous detection to measure the magnetostriction of soft magnetic films is described. The instrument measures 2 AA magnetostrictive deflections of Permalloy films on 500 mu m silicon substrates. Saturation magnetostriction of 10/sup -9/ can be measured for 1000 nm films on 100 mu m Si substrates. The ultimate resolution of the interferometer is 0.1 AA as demonstrated using piezoelectrically-driven mirrors.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

References

9