Z-scan studies in the thin- and the thick-sample limits

Abstract

Z-scan studies have been carried out on CS2 with a 6.5-ns, doubled Nd:YAG source. Sample thicknesses ranged from the nearly thin- through the thick-sample regime. The data were analyzed with both an analytic theory, correct to first order in irradiance, and a Gaussian Laguerre modal-decomposition modeling approach, correct to all orders. It was found that the n2 values obtained through both methods of analysis were in agreement to within 10%. The results also indicate that a suitable thickness for a self-focusing optical power limiter is six times the Rayleigh length in the medium.