Current conveyor based test structures for mixed-signal circuits

Abstract

Current-mode designs for mixed-signal testing are presented. The proposed structures are based on the use of second generation current conveyors (CCII) and they can be applied for voltage or current testing of analogue or digital circuits. A simple current sensor for on-chip current monitoring is described, giving an accurate analogue output proportional to the variation of the quiescent current; experimental results show the functionality of the proposed configuration and its linear output characteristic. An analogue test structure for multiple test point observation is also presented. The operation of the proposed structure has been verified using the PSPICE simulator; experimental measurements have also been made using CMOS current conveyors.