24 h stability of thick multilayer silicene in air

Abstract

Thick epitaxial multilayer silicene films with a √3×√3R(30°) surface structure
\nshow only mild surface oxidation after 24 h in air, as measured by Auger
\nelectron spectroscopy. X-ray diffraction and Raman spectroscopy measurements
\nperformed in air without any protective capping, as well as, for comparison, with
\na thin Al2O3 cap, showed the (002) reflection and the G, D and 2D Raman
\nstructures, which are unique fingerprints of thick multilayer silicene.