Application of atomic scale STEM techniquesto the study of interfaces and defects in materials

Abstract

Incoherent imaging and analysis techniques in the scanning transmission electron microscope (STEM) provide the potential to map changes in structure, composition and bonding that occur at materials interfaces and defects on the fundamental atomic scale. Such comprehensive characterization capabilities permit a detailed analysis of the structure-property relationships of interfaces and defects to be performed. In this paper, we discuss the resolution limits of such techniques in the JEOL 2010F STEM/TEM operating both under standard conditions and at elevated temperatures. Examples of the use of such techniques to quantify the atomic scale defect chemistry at interfaces and defects in perovskite oxides, the growth and structure of II-VI and III-V quantum dots and the electronic structure of threading dislocations in GaN will also be presented.