Publication | Closed Access
Characteristics of metal-insulator-metal point-contact diodes used for two-laser mixing and direct frequency measurements
34
Citations
7
References
1973
Year
EngineeringLaser ApplicationsHigh-power LasersMetal-insulator-metal Point-contact DiodesElectromagnetic CompatibilityOptical PropertiesBarrier Shunt CapacitanceInstrumentationPulsed Laser DepositionArgon Ion LaserElectrical EngineeringHigh-frequency DeviceLaser Processing TechnologyTwo-laser MixingLaser-assisted DepositionMicrowave EngineeringDirect Frequency MeasurementsMim DiodeApplied PhysicsOptoelectronics
The frequency response characteristics of metal-insulator-metal (MIM) diodes used for direct-frequency measurements in the submillimeter and infrared spectral region have been determined and it is found that these may be described by a simple model based on aerial impedance and barrier shunt capacitance. In addition, an MIM diode has been used to detect visible radiation from an argon ion laser.
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