Precision measurement method for cryogenic amplifier noise temperatures below 5 K

Abstract

We report precision measurements of the effective input noise temperature of a cryogenic (liquid-helium temperature) monolithic-microwave integrated-circuit amplifier at the amplifier reference planes within the cryostat. A method is given for characterizing and removing the effect of the transmission lines between the amplifier reference planes and the input and output connectors of the cryostat. In conjunction with careful noise measurements, this method enables us to measure amplifier noise temperatures below 5 K with an uncertainty of 0.3 K. The particular amplifier that was measured exhibits a noise temperature below 5.5 K from 1 to 11 GHz, attaining a minimum value of 2.3 K/spl plusmn/0.3 K at 7 GHz. This corresponds to a noise figure of 0.034 dB/spl plusmn/0.004 dB. The measured amplifier gain is between 33.4 dB/spl plusmn/0.3 dB and 35.8 dB/spl plusmn/0.3 dB over the 1-12-GHz range.