IEEE Transactions on Industrial Electronics · 2006 · 20 citations · 12 references
EngineeringElectrical EngineeringCircuit TheoryPower ElectronicsSystems AnalysisController TuningDc-ac InvertersDc-dc ConversionDc-dc ConvertersBoost ConvertersDc-dc Converter ControlNyquist PlotsPhase MarginRoot LocusRoot Locus Analysis
An experimental method is proposed to estimate all design specifications represented by circles in the Nyquist plane (e.g., phase margin, sensitivity, and closed-loop bandwidth) in case of closed-loop dc/dc switching converters. The method is based on the complete root contour (CRC) analysis in the root locus plane. All typical specifications for controller design are experimentally checked in case of a boost converter, using only input/output data. The main innovation of this paper is the automatic and systematic application of the CRC method to controlled dc-dc converters. The classic relay-based structure for an experimental estimation of the critical parameters (autotune variation) is compared with a different technique, called sinusoidal autotune variation, more efficient in the case of nonlow-pass systems
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