Publication | Closed Access
Electron-Stimulated Modification of Si Surfaces
59
Citations
22
References
1999
Year
Materials ScienceMild IrradiationEngineeringPhysicsTunneling MicroscopyNanoelectronicsElectron-stimulated ModificationSurface ScienceApplied PhysicsSurface AnalysisDimer VacanciesAtomic PhysicsSiliceneIncident EnergySemiconductor Device FabricationSilicon On InsulatorSurface Reconstruction
Scanning tunneling microscopy studies show significant structural modifications that involved atom desorption and displacement following mild irradiation by electrons of 90--2000 eV. For $\mathrm{Si}(111)\ensuremath{-}(7\ifmmode\times\else\texttimes\fi{}7)$, adatom layer vacancies increased monotonically with incident energy. For $\mathrm{Si}(100)\ensuremath{-}(2\ifmmode\times\else\texttimes\fi{}1)$, irradiation produced dimer vacancies, and ad-dimers as Si atoms transferred to the terrace. The modification processes are tied to the energy distribution of electron-hole and electron attachment states achieved by inelastic cascade scattering. Hence, beams previously believed to be benign induce surface structural modifications.
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