Temporal contrast in Ti:sapphire lasers, characterization and control

Marc Nantel, Jiro Itatani, An-Chun Tien, J. Fauré, D. Kaplan, M. Bauvier, Takashi Buma, P. Van Rompay, J. S. Nee, P. P. Pronko,

IEEE Journal of Selected Topics in Quantum Electronics · 1998 · 85 citations · 58 references

Concepts

Abstract

As ultrafast lasers achieve ever higher focused intensities on target, the problem of ensuring a clean laser-solid interaction becomes more pressing. In this paper, we give concrete examples of the deleterious effects of low-contrast interactions, and address the problem of subpicosecond laser intensity contrast ratio on both characterization and control fronts. We present the new technique of high-dynamic-range plasma-shuttered streak camera contrast measurement, as well as two efficient and relatively inexpensive ways of improving the contrast of short pulse lasers without sacrificing on the output energy: a double-pass Pockels cell (PC), and clean high-energy-pulse seeding of the regenerative amplifier.

References

58