IEEE Transactions on Microwave Theory and Techniques · 2001 · 44 citations · 12 references
Natural SciencesElectrical EngineeringPhysicsCondensed Matter PhysicsMaterials CharacterizationThin FilmsDielectricsHigh-temperature MaterialsSuperconducting MaterialsSuperconducting Thin FilmsThin Film Electrical PropertiesDielectric ResonatorsHigh-temperature Superconducting FilmsHigh-temperature SuperconductivityHigh-temperature SuperconductorsQ FactorSuperconducting ResonatorsSurface ResistanceSurface Resistance Measurement
To accurately determine the surface resistance of high-temperature superconducting films, multifrequency measurements of S/sub 21/, S/sub 11/, and S/sub 22/ and sophisticated data processing are required. As a result, surface resistance measurements and calculations for varying temperatures are very time consuming. In this paper, we introduce a simplified method for calculations of the unloaded Q (Q/sub 0/) factor, which require measurements of S/sub 11/ and S/sub 22/ at the lowest temperature only. For all other temperatures, only S/sub 21/ measurements are needed. The method has been shown to give sufficiently accurate Q/sub 0/ values and, hence, the surface resistance of superconducting samples, as compared to results obtained from S/sub 21/, S/sub 11/, and S/sub 22/ measurements using the transmission-mode Q factor technique. The presented method has been tested under different coupling coefficients and frequencies.
12
D.L. Birx · Journal of the Franklin Institute · 1957 · 119 citations
Kenneth Leong, J. Mazierska · IEEE Transactions on Microwave Theory and Techniques · 2002 · 115 citations
Engineering, Electrical Engineering, Materials Characterization +16