Publication | Closed Access
Single-mode junction-up TJS lasers with estimated lifetime of 10<sup>6</sup>hours
25
Citations
6
References
1979
Year
Optical MaterialsEngineeringLaser ScienceLaser PhysicsLaser ApplicationsLaser MaterialAccelerated Life TestLaser SimulationHigh-power LasersLaser OpticsOptical PropertiesOptical DiagnosticsPhotonicsPhysicsLaser ChipsLaser Processing TechnologyLaser-induced BreakdownApplied PhysicsLaser SafetyOptoelectronicsSi SubmountsLaser Damage
Accelerated life test for single-mode junction-up TJS lasers have been carried out at ambient temperatures of 50, 60, 70, 80, and 90°C. The laser chips are passivated with Si <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> N <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">4</inf> films and die bonded on Si submounts. Estimated mean time to failure is 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">6</sup> h at 25°C.
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