Publication | Open Access
Critical thickness for two‐dimensional tearing instability
10
Citations
13
References
2004
Year
Critical ThicknessEngineeringMechanical EngineeringPlasma SciencePlasma PhysicsElectron OpticPlasma ElectronicsMechanicsPlasma TheoryStressstrain AnalysisStress WavePhysicsStrain LocalizationMode Saturation StatePlasma InstabilitySolid MechanicsCurrent Sheet ThicknessApplied PhysicsCondensed Matter PhysicsMechanics Of MaterialsCurrent Sheet
Dependence of tearing mode saturation state on the current sheet thickness is investigated by two‐dimensional (2‐D) full particle simulations. When the system length L x is taken to be the wavelength of the maximum growth mode L x = λ max = 12D (D: half‐thickness of the current sheet), the instability is found to saturate without producing significant reconnection if D > D cr 1st = 3.5 λ e , where λ e is the electron inertial length. When the system length is doubled L x = 2λ max , only insignificant effects are available for D > D cr 2nd = 2.7λ h , where λ h is the ion‐electron hybrid inertial length. Comparing these 2‐D results with a recent 3‐D result, it is shown clearly that a three‐dimensional effect reduces the current sheet thickness and thus leads to quick production of substantial reconnection even if D > D cr 1st .
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