Light propagation through microlenses: a new simulation method

Abstract

A new numrical method is described for analysis of the imaging properties of microlenses. This wave-propagation method is compared with the classical beam-propagation method from which it is derived. The applicability of the two methods is given and demonstrated by examples. The beampropagation method is fast but is applicable only for small apertures; the new wave-propagation method requires no paraxial approximation but requires more computational effort.