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Corrections on "Optimal Step-Stress Test Under Progressive Type-I Censoring

Donghoon Han, N. Balakrishnan, Ananda Sen, Evans Gouno

IEEE Transactions on Reliability · 2006 · 44 citations · 1 references

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Optimal Step-Stress Test Under Progressive Type-I Censoring

Evans Gouno, Ananda Sen, N. Balakrishnan · IEEE Transactions on Reliability · 2004 · 146 citations

, , +10