Surface and Interface Analysis · 2005 · 293 citations · 14 references
Natural SciencesPhysicsAtomic PhysicsComputational ChemistryPhysical ChemistryAtomic Energy LevelsAtomistic SimulationAtomic Number DependenceElectron Escape DepthSecondary Electron Production
The study provides a comprehensive examination of secondary electron yield as a function of primary energy and atomic number for 44 elements. The authors describe the semi‑empirical universal law for SE yield and develop a Monte‑Carlo simulation template, applying both universal curve fitting and simulation to all 44 elements. They tabulate and plot the maximum SE yield, its corresponding primary energy, excitation energy, and effective escape depth versus atomic number, revealing that these parameters exhibit patterns linked to atomic shell filling. © 2005 John Wiley & Sons, Ltd.
Abstract A new and thorough examination of secondary electron (SE) yield as a function of primary energy ( E PE ) and atomic number Z for the 44 elements in the database 1 is made. The principles of the semiempirical universal law for the SE yield are described and a template for Monte Carlo (MC) simulation is produced accordingly. Both universal curve fitting and MC simulation are made for the 44 elements. The resulted maximum SE yield δ m , corresponding primary energy $E_{\rm {PE}}^{\rm {m}}$ , SE excitation energy ε, and effective escape depth λ are tabulated and plotted as a function of atomic number Z. It is found that similarities exist in the profiles of ε and λ, δ m and $E_{\rm {PE}}^{\rm {m}}$ , and all of these parameters seem to have characteristics associated with atomic shell filling. Copyright © 2005 John Wiley & Sons, Ltd.
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An empirical stopping power relationship for low‐energy electrons
David C. Joy, Shenghong Luo · Scanning · 1989 · 454 citations
A Theory of Secondary Electron Emission from Metals
E. M. Baroody · Physical Review · 1950 · 231 citations