2009 · 93 citations · 11 references
EngineeringComputer EngineeringElectrical EngineeringAnalog ElectronicsMicroelectronicsSystem-on-chip DesignAnalog Integrated CircuitsDetector TechnologyImage AcquisitionMedical Imaging InstrumentationMixed-signal Integrated Circuit DesignMixed-signal IntegrationAnalog-digital ConversionAnalog-to-digital ConversionCounter DesignPhoton CountingPixelated Detector ArraysPower ConsumptionSingle-photon Avalanche DiodesTime Resolution
A Time-to-Amplitude Converter (TAC) with embedded analog-to-digital conversion is implemented in a 130-nm CMOS imaging technology. The proposed module is conceived for Single-Photon Avalanche Diode imagers and can operate both as a TAC or as an analog counter, thus allowing both time-correlated or time-uncorrelated imaging operation. A single-ramp, 8-bit ADC with two memory banks to allow high-speed, time-interleaved operation is also included within each module. A 32times32-TACs array has been fabricated with a 50-mum pitch in order prove the highly parallel operation and to test uniformity and power consumption issues. The measured time resolution (LSB) is of 160 ps on a 20-ns time range with a uniformity across the array within plusmn2 LSBs, while DNL and INL are 0.7 LSB and 1.9 LSB respectively. The average power consumption is below 300 muW/pixel when running at 500 k measurements per second.
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Full-speed testing of A/D converters
J. Doernberg, H.-S. Lee, D.A. Hodges · IEEE Journal of Solid-State Circuits · 1984 · 517 citations