IEEE Microwave and Guided Wave Letters · 1995 · 52 citations · 7 references
EngineeringFar-field MeasurementMicrowave TransmissionPhysical PropertyApproximate Admittance ModelsOptical PropertiesRigorous Mathematical ModelsAperture AdmittanceHigh Impedance SurfacesMaterials ScienceMaterials EngineeringElectrical EngineeringAntenna TestingMicrowave MeasurementMicrowave DiagnosticsMicrowave EngineeringComplex PermittivityElectrical PropertyApplied PhysicsOpen-ended Coaxial ProbeElectrical Insulation
A number of papers have appeared on the characterization of materials using a coaxial probe. In most cases, approximate admittance models have been used for this purpose. The present work compares two rigorous mathematical models for the aperture admittance. One of these relations is based on the variational principle while the other utilizes the method of moments. Muller's method is then used to determine the complex permittivity of materials. The two procedures have been tested in the frequency range of 1-18 GHz.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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Savitzky-Golay Smoothing Filters
William H. Press, Saul A. Teukolsky · Computers in Physics · 1990 · 11.6K citations · Full text
Dielectric materials and applications
Raymond M. Fuoss · Journal of Chemical Education · 1955 · 910 citations
D. K. Misra, M. Chabbra, Benjamin R. Epstein et al. · IEEE Transactions on Microwave Theory and Techniques · 1990 · 233 citations