Philosophical magazine · 1969 · 16 citations · 11 references
Natural SciencesMaterials EngineeringMaterials ScienceCrystal StructureMetallurgySolid State PhysicsCrystal GrowthCrystal LatticeCrystallographyMineral GrowthX-ray CrystallographyX-ray DiffractionCrystal Growth MorphologyDislocation CharacterizationDislocationsSingle-crystal GrowthX-ray Structure DeterminationX-ray Topography
Abstract X-ray topography shows that single-crystal octahedra of potash alum grown from solution may contain very few dislocations, most of them being generated in the initial stage of crystal growth. In crystals of irregular habit more dislocations are found outcropping on the faster-growing faces than on the slower. Some crystals are sufficiently perfect to permit absolute measurement of the x-ray structure factor from the the x-ray Pendellösung period.
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Archibald Howie, M. J. Whelan · Proceedings of the Royal Society of London A Mathematical and Physical Sciences · 1962 · 364 citations
A study of pendellösung fringes in X-ray diffraction
N. Kato, A. R. Lang · Acta Crystallographica · 1959 · 257 citations