Rigorous coupled-wave analysis of metallic surface-relief gratings

TLDR

The paper presents a rigorous coupled‑wave analysis for metallic surface‑relief gratings. The analysis permits arbitrary complex permittivity, handles both TE and TM polarizations at any incidence angle, and evaluates diffraction for rectangular‑groove gold gratings at 0.5, 1.0, and 10.0 µm over varying period, groove depth, polarization, and angle. The study finds that TM diffraction varies more rapidly than TE, achieves 95 % first‑order efficiency at 10 µm, exhibits <0.1 % zero‑order specular reflectivity for both polarizations, absorbs >50 % of incident power at 0.5 µm, and shows that the perfect‑conductor approximation is invalid for TM at all wavelengths and for TE at 0.5 µm.

Abstract

A rigorous coupled-wave analysis for metallic surface-relief gratings is presented. This approach allows an arbitrary complex permittivity to be used for the material and thus avoids the infinite conductivity (perfect-conductor) approximation. Both TE and TM polarizations and arbitrary angles of incidence are treated. Diffraction characteristics for rectangular-groove gold gratings with equal groove and ridge widths are presented for free-space wavelengths of 0.5, 1.0 and 10.0 μm for all diffracted orders as a function of period, groove depth, polarization, and angle of incidence. Results include the following: (1) TM-polarization diffraction characteristics vary more rapidly than do those for TE polarization, (2) 95% first-order diffraction efficiency occurs for TM polarization at 10.0 μm, (3) &lt;0.1% zero-order specular reflectivity occurs for both TE and TM polarizations, (4) &gt;50% absorption of incident power occurs at 0.5 μm, and (5) the perfect-conductor approximation is not valid for TM polarization at any of the wavelengths and is not valid for TE polarization at 0.5 μm.