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Measurement of Sheet Resistivities with the Four-Point Probe
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1958
Year
Materials ScienceCircular SamplesEngineeringResistorNondestructive TestingMeasurementCalibrationCorrection FactorsMechanical EngineeringApplied PhysicsSheet ResistiritiesSpecific ResistanceEducationComputational ElectromagneticsInstrumentationElectrical PropertyElectrical InsulationFour-point Probe
Correction factors are evaluated for the measurement of sheet resistirities on two-dimensional rectangular and circular samples with the four-point probe. Diffused surface layers can be treated as two-dimensional structures, but the factors are also useful in obtaining body resistivities on thin samples.
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