Publication | Closed Access
The origin of an anomalous, low 2θ peak in x-ray diffraction spectra of MoS<sub>2</sub> films grown by ion beam assisted deposition
27
Citations
6
References
1997
Year
Materials ScienceTransition Metal ChalcogenidesX-ray SpectroscopyEngineeringCrystalline DefectsPhysicsX-ray DiffractionCondensed Matter PhysicsApplied PhysicsLow 2θIon BeamX-ray Diffraction SpectraThin Films
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