Millimeter-wave antenna measurement

Abstract

A novel approach is presented to accurately measure the scattering parameters as well as the radiation pattern of planar antennas that operate in the millimeter-wave frequency band. To avoid interconnection problems, RF probes have been used to connect to the antenna. These RF probes are normally used for the characterisation of devices on a semiconductor wafer. Here, they are used to characterise antennas that can be realised in any planar manufacturing technology. A completely planar transition is designed to transform the coplanar waveguide transmission line that is required by the RF probe to a microstrip line. It is shown that this transition can be de-embedded from the measurements. Moreover, a measurement setup has been built for the measurement of the far-field radiation pattern of millimeter-wave antennas and antenna arrays. This setup allows to connect the antenna under test with an RF probe and can measure the radiation pattern in the whole upper hemisphere.